Measurement and Detection of Nano Level Vibration Based on Tenneling Effect

Li Mengchao,Fu Xing,Hu Xiaotang
DOI: https://doi.org/10.13382/j.jemi.2008.02.004
2008-01-01
JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT
Abstract:Scanning tunneling microscopy is a nano level surface measurement instrument with high precision,because of the several nanometer tunneling gap,external random low frequency vibration has great influence on the measurement result.It is very useful to study the influence of the nano level vibration on the tunneling gap.Experiments demonstrate that the system has good amplitude-frequency response to the nano level vibration in the tunneling state.
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