NOVEL ETCHING TECHNOLOGY OF INP BY INDUCTIVELY COUPLED PLASMA1

Chang-Zheng Sun,Jin-Bo Zhou,Bing Xiong,Yi Luo
2000-01-01
Abstract:We report on the room temperature dry etching of InP by inductively coupled plasma (ICP) using Cl2/CH4/Ar mixtures. Under optimized conditions, vertical sidewall and smooth surface can be obtained simultaneously, together with a moderate etch rate and a good select ratio. The root-mean-square surface roughness is measured to be as low as 0.274 nm. To our knowledge, this is the best result for InP to date.
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