Growth and Characterization of Znin2se4 Buffer Layer on Cuinse2 Thin Films

Xianzhong Sun,Yue He,Jiayou Feng
DOI: https://doi.org/10.1016/j.jcrysgro.2009.10.003
IF: 1.8
2009-01-01
Journal of Crystal Growth
Abstract:The p-type CuInSe2 (CIS) films were prepared by electrodeposition following the vacuum annealing process. Zn element was diffused into the CIS film samples at 350°C by heating Zn grains in vacuum. Then, ZnIn2Se4 (ZIS) buffer layer was fabricated on CIS thin film by this thermal diffusion process. The formation of ZIS phase was confirmed by X-ray diffraction pattern (XRD), Raman spectroscopy, and X-ray photoelectron spectroscopy (XPS). Dark I–V measurement shows that the Zn-doped CIS (0.89at%)/Mo structure reveals the rectifying property, which indicates that a p–n junction was formed.
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