Ohmic Contact for InP-Based HEMTs

Liu Liang,Yin Junjian,Li Xiao,Zhang Haiying,Li Haiou,He Zhijing,Liu Xunchun
DOI: https://doi.org/10.3969/j.issn.1674-4926.2006.11.016
2006-01-01
Journal of Semiconductors
Abstract:An ohmic contact experiment is conducted for InP-based high electron mobility transistors (HEMTs) with two different metal structures of Ni/Ge/Au and Ni/Ge/Au/Ge/Ni/Au.Comparison is made between rapid thermal annealing (10~40s) and alloying over a long time(10min).Optimized alloying conditions for the InP-based HEMT are obtained.Using the Ni/Ge/Au/Ge/Ni/Au structure,a typical contact resistance of 0.068Ω·mm is achieved by alloying at 270℃ for 10min.
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