Study on HF Vapor-Phase Etching for Suspended Nano Structure Fabrication

Zhang Wei,Liu Zewen
DOI: https://doi.org/10.3969/j.issn.1003-353x.2009.12.004
2009-01-01
Abstract:HF vapor-phase etching was studied under different temperatures and different conditions for fabrication of suspended nano structure.Using selfmade HF vapor-phase etching equipment and using HF/H2O vapor and HF/CH3CH2OH vapor as working gas,PECVD SiO2 sacrificial layer etchings are performed.The HF/H2O vapor etching rates are measured respect to different substrate temperatures.Experimental results show that the etching rates of HF/H2O vapor and HF/CH3CH2OH are 11.5 and 7.6 nm/s at room temperature and atmosphere pressure.The HF/H2O vapor etching rate decreased with wafer temperature increasing and are 10.25,7.95 and 5.18 nm/s at the temperature of 35,40 and 50 ℃,respectively.Nano suspended structure with 400 nm gap between structure and wafer substrate is fabricated by the HF vapor phase etching method.
What problem does this paper attempt to address?