Design of a High-Speed Flip-Around Sample-and-Hold Circuit

YAO Ruo-he,ZHU Jian-pei,WU Wei-jing,ZHANG Wei-hua
DOI: https://doi.org/10.3969/j.issn.1004-3365.2006.02.025
2006-01-01
Abstract:Major factors affecting the performance of flip-around sample-and-hold circuit are analyzed.A bootstrapped switch with dummy transistor is used to reduce the signal-dependent charge injection and clock feedthrough.The gain boost technique is used to enhance the DC gain of the main opamp,and the best transient performance has been achieved by adjusting the load capacitances of the auxiliary amplifiers.A flip-around sample-and-hold circuit based on these techniques has been designed and simulated in TSMC′s 0.25 μm CMOS process.Simulation results show that the sample-and-hold circuit has a good performance.
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