Analysis on preferred orientation and purity estimation of Ti3SiC2

Ke Tang,Chang-an Wang,Yong Huang,Xingli Xu
DOI: https://doi.org/10.1016/S0925-8388(01)01680-2
IF: 6.2
2001-01-01
Journal of Alloys and Compounds
Abstract:Ti3SiC2 is a remarkable material for it possesses a combination of many of the best properties of metals and ceramics. During studies of Ti3SiC2, {000l} planar texture commonly exists, which is mainly caused by its specific grain morphology and the pressure brought on Ti3SiC2 grains. In this work, the normal way to prepare powder XRD samples is improved to avoid the {000l} planar texture, and we point out that the diffraction data in the JCPDS card is flawed. To understand the anisotropy of Ti3SiC2 more clearly, a function fitting method is used to investigate the distribution of Ti3SiC2 basal planes in bulk polycrystalline samples. The estimation of Ti3SiC2 volume percentage is also studied according to the characteristics of {000l} planar texture.
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