A study on powder X-ray diffraction of Ti3SiC2

Ke Tang,Chang-an Wang,Xingli Xu,Yong Huang
DOI: https://doi.org/10.1016/S0167-577X(01)00618-8
IF: 3
2002-01-01
Materials Letters
Abstract:In an X-ray diffraction study of titanium silicon carbide (Ti3SiC2), it is a big problem that the relative intensity of {008} peak observed in JCPDS card diverges greatly with the calculated one. This case is mainly caused by the {001} planar texture in the powder XRD sample. To distribute the crystal planes of Ti3SiC2 randomly, some equiaxed TiC particles are added to the Ti3SiC2 powders, and no pressure is brought on the powders. The observed XRD data agree well with the calculated ones.
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