A Novel Self-Test Structure for Time-Divided Closed-Loop MEMS Capacitive Accelerometer

黄靖清,张婷婷,赵猛,伍峰,陈中建,洪理琛,张雅聪,鲁文高,郝一龙
DOI: https://doi.org/10.3969/j.issn.1672-6030.2013.05.007
2013-01-01
Nanotechnology and Precision Engineering
Abstract:This paper presents a novel self-test structure for closed-loop capacitive accelerometer. The mechanism of the self-test function based on charge injection is explained. For a time-divided closed-loop accelerometer,the theoretical relationship between its voltage output and the self-test voltage is deduced and then verified by Matlab / Simulink model. The readout circuit was fabricated using 0. 35 μm HV CMOS process. Test results show a sensitivity of about 0. 3 V / V in the self-test mode.
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