Design and realization of testing instrument applied to MEMS accelerometer sensor

Li Tongjie,Dong Jingxin,Liu Yunfeng,Kong Xingwei,Zhao Changde
DOI: https://doi.org/10.3969/j.issn.1002-8978.2008.04.008
2008-01-01
Abstract:This paper presents a MEMS sensor testing instrument,which is composed of a capacitance measuring circuit and a virtual instrument(VI) spectrum analyzer.This instrument has the function of obtaining a certain important parameters of the MEMS sensor automatically through capacitance measuring,VI spectrum analyzing and the VI program.The capacitance measuring circuit and spectrum analyzer are calibrated separately in the lab.The maximal nonlinear error of the capacitance measuring circuit is 0.127 7%;the maximal amplitude error of the spectrum analyzer gets 0.352 6 dB and the maximal phase error reaches 1.365 6°.
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