Effects of technological parameters in magnetron sputtering process on properties of metallized films

MA Yuan-yuan,WANG De-miao,JIN Hao
IF: 4
2008-01-01
Vacuum
Abstract:Magnetron sputtering process will be the basic trend to the metallization of thin films because of its environment-friendly high quality and simple operation. Effects of the technological parameters on the properties of metallized thin film were therefore studied. The results revealed that the properties of Cr(150 nm)/Ni-Cu(460nm)/Ag(200 nm) multilayer film deposited via magnetron sprttering process will be the best when the sputtering power is 20W·cm-2 with substrate-to-target distance 8cm under the air pressure 0.5Pa. The bonding strength of the film is up to 6.19MPa with high-temperature weldability up to 100%.
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