Fabrication of High Aspect Ratio Muti-Steps on Si by Dry Etching

Liu Peng,Zhang Dacheng,Li Ting,Luo Kui,Tian Dayu,Li Jing
DOI: https://doi.org/10.3969/j.issn.1671-4776.2009.12.010
2009-01-01
Abstract:Dry etching of high aspect ratio Si steps is a basic technique in MEMS.Many complicated MEMS-chips are fabricated by multi-step etching method.1 μm SiO2 as a passive layer was prepared by LPCVD.The experiments of depositing and removing passive layers were studied.And taking three steps as an example,a method of preparing passive layers by using one mask was developed.Instead of using different masks,this method is economy,easy to operate,and repeatable.What's more,the remaining of passive layers may damage the step surface in the process of dry etching.Therefore,the effect of removing method of SiO2 masks on the step surface during the process was studied.The experiment shows that the method combined dry etching and wet etching can remove the step mask effectively and obtain a better Si step structure.
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