Low-temperature PECVD of Nanodevice-Grade Nc-3C-sic

Qijin Cheng,Shuyan Xu,Jidong Long,Kostya Ken Ostrikov
DOI: https://doi.org/10.1002/cvde.200706624
2007-01-01
Chemical Vapor Deposition
Abstract:In this work, we report a plasma-based synthesis of nanodevice-grade nc-3C-SiC films, with very high growth rates (7-9 nm min-1) at low and ULSI technology-compatible process temperatures (400-550 °C), featuring: (i) high nanocrystalline fraction (67% at 550 °C); (ii) good chemical purity; (iii) excellent stoichiometry throughout the entire film; (iv) wide optical band gap (3.22-3.71 eV); (v) refractive index close to that of single-crystalline 3C-SiC, and; (vi) clear, uniform, and defect-free Si-SiC interface. The counter-intuitive low SiC hydrogenation in a H2-rich plasma process is explained by hydrogen atom desorption-mediated crystallization.
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