DISLOCATION DENSITY IN SrTiO3 FILM GROWN ON DyScO3 BY PULSE LASER ABLATION

Z. Y. ZHAI,X. Z. LI,S. S. ZHI,X. S. WU,J. H. HAO,J. GAO
DOI: https://doi.org/10.1142/S0218625X07010251
2007-01-01
Surface Review and Letters
Abstract:SrTiO3 films are fabricated on DyScO3 substrates by pulse laser deposition. In situ X-ray diffraction ( XRD) is used to characterize the thermal expansion coefficient at low temperature. The abnormal behavior in lattice parameter at 80K may be the hint of a phase transition. High resolution XRD is performed to detect the two kinds of dislocations, i.e. screw and edge. Results show that the density of edge dislocation is a little larger than that of the screw one. The total dislocation density has the order of about 108 cm(-2). Edge dislocation density decreases with the increase of the film thickness. We argue that the ratio between these two dislocation densities results in the growth mode of the film.
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