Dislocation in SrTiO_3 Film Grown on DyScO_3 by Pulse Laser Ablation

Wu Xiaoshan
2009-01-01
Abstract:SrTiO3(STO) films are fabricated on DyScO3(DSO) substrates by pulse laser deposition.In-situ X-ray diffraction(XRD) at the temperature range of 20~300 K is used to characterize the thermal expansion coefficient at low temperature.The lattice mismatch dependence of temperature between STO film and the substrate is also determined.The abnormal behavior in lattice parameter at 80 K may be the hint of a phase transition.High resolution XRD is performed to detect the distribution of two kinds of dislocations,i.e.,screw and shear.Results show that the density of total screw dislocation is much larger than the shear one.We believe that the screw dislocation is the main defects formed at the beginning of the film growth.Shear dislocation increases with the increase of the film thickness.We argue that the ratio between these two dislocations results in the growth mode of the film.
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