Observation of Temperature Induced Phase Transitions in TiO Superconducting Thin Film Via Infrared Measurement
Shun Zhou,Chao Zhang,Wen Xu,Jie Zhang,Yiming Xiao,Lan Ding,Hua Wen,Xingjia Cheng,Chuansheng Hu,Haowen Li,Xiaoguang Li,Francois M. Peeters
DOI: https://doi.org/10.1016/j.infrared.2024.105160
IF: 2.997
2024-01-01
Infrared Physics & Technology
Abstract:In contrast to conventional polycrystalline titanium oxide (TiO), it was found recently that the superconducting transition temperature Tc can be significantly enhanced from about 2 K to 7.4 K in cubic TiO thin films grown epitaxially on alpha-Al2O3 substrates. This kind of TiO film is also expected to have distinctive optoelectronic properties, which are still not very clear up to now. Herein, by using infrared (IR) reflection measurement we investigate the temperature-dependent optoelectronic response of a cubic TiO thin film, in which temperature induced phase transitions are observed. The semiconductor-, metallic- and semiconductor-like electronic phases of this superconducting film are found in the temperature regimes from 10 to 110 K, 110 to 220 K and above 220 K, respectively. The results obtained optically are consistent with those measured by transport experiment. Furthermore, based on an improved reflection model developed here, we extract the complex optical conductivity of the cubic TiO thin film. We are able to approximately determine the characteristic parameters (e.g., effective electron mass, carrier density, scattering time, etc.) for different electronic phases by fitting the optical conductivity with the modified Lorentz formula. These results not only deepen our understanding of the fundamental physics for cubic TiO thin films but also may find applications in optoelectronic devices based on superconductors.