Influence of stress on Raman spectra in Ba1-xSrxTiO3 thin films

Liqiang Cao,B L Cheng,Wang Shuaihua,Wangyang Fu,Shuqiang Ding,Zhi Sun,Hongtao Yuan,Yuwei Zhou,Zonghai Chen,G. Z. Yang

DOI: https://doi.org/10.1088/0022-3727/39/13/027

2006-01-01

Abstract:Ba1-xSrxTiO3 (x = 0.3, 0.5, 0.7) thin films have been prepared on (001) MgO substrates by pulsed laser deposition. Temperature-dependent permittivity and Raman spectra of the Ba1-xSrxTiO3 films are compared with those of the corresponding bulk samples. Raman spectra indicate that a tetragonal structure is present in the Ba0.5Sr0.5TiO3 thin film while the Ba0.5Sr0.5TiO3 bulk sample shows a cubic structure. Temperature-dependent permittivity shows that the phase transition in the film occurs over a wide temperature range, which results in the co-existence of the cubic phase and tetragonal phase in the Ba0.5Sr0.5TiO3 film. The smooth change of phase transition is attributed to the residual stress in the film. We demonstrate that the residual stress releases gradually with increasing thickness of the film. Furthermore, the effects of the composition and thickness on Raman spectra have also been discussed systematically.