Cubic to tetragonal phase transition of SrTiO3 under epitaxial stress : An X-ray backscattering study

E. Sozontov,Lixin Cao,J. Zegenhagen
DOI: https://doi.org/10.1002/1521-396X(200010)181:2<387::AID-PSSA387>3.0.CO;2-5
2000-10-01
Abstract:Employing synchrotron radiation in backscattering geometry we studied the 105 K cubic to tetragonal (CT) phase transition of SrTiO 3 by X-ray diffraction using the (006) reflection of three (001) oriented samples. Two of the crystals were covered with ultra-thin films of YBa 2 Cu 3 O 7-δ (14 nm) and GdBa 2 Cu 3 O 7-δ (28 nm), respectively. We find that the stress induced by the epitaxial layers influences the behavior of the CT transition in two ways. (i) The critical temperature increases by 1.2 K as a result of the homogeneous epitaxial stress (13.5 MPa) introduced into the substrate by the pseudomorphic GdBa 2 Cu 3 O 7-δ film. (ii) Strain affects the critical exponent of the temperature dependence of the order parameter. Furthermore, the microstructure of the tetragonal domains and its temperature dependence are markedly different for the three samples.
Physics,Materials Science
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