Polarization-Dependent Raman Spectroscopy of Epitaxial TiO2(B) Thin Films

Jacob R. Jokisaari,Dylan Bayerl,Kui Zhang,Lin Xie,Yuefeng Nie,Darrell G. Schlom,Emmanouil Kioupakis,George W. Graham,Xiaoqing Pan
DOI: https://doi.org/10.1021/acs.chemmater.5b02806
IF: 10.508
2015-01-01
Chemistry of Materials
Abstract:The bronze polymorph of titanium dioxide, known as TiO2(B), has promising photochemical and electronic properties for potential applications in Li-ion batteries, photocatalysis, chemical sensing, and solar cells. In contrast to previous studies performed with powder samples, which often suffer from impurities and lattice water, here we report Raman spectra from highly crystalline TiO2(B) films epitaxially grown on Si substrates with a thin SrTiO3 buffer layer. The reduced background from the Si substrate significantly benefits acquisition of polarization-dependent Raman spectra collected from the high-quality thin films, which are compared to nano-powder results reported in the literature. The experimental spectra were compared with density functional theory calculations to analyze the atomic displacements associated with each Raman-active vibrational mode. These results provide a standard reference for further investigation of the crystallinity, structure, composition, and properties of TiO2(B) materials with Raman spectroscopy.
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