The Crystallographic Relationship of Heteroepitaxial Diamond Films on Scratched Silicon Substrates

QJ Gao,LP You,XH Pan,F Zhang,XF Peng,ZD Lin
DOI: https://doi.org/10.1016/s0925-9635(97)00147-7
IF: 3.806
1997-01-01
Diamond and Related Materials
Abstract:By using the straight hot filament chemical vapor deposition method with one falt horizonatal filament, diamond films were rapidly grown on a scratched silicon substrate. Observing two kinds of interface structures of the samples by cross-section high-resolution transmission electron microscopy, we found that diamond {111}-oriented films are epitaxially grown on β-SiC{111} planes with a tilt angle of about 7° around the common [110] axis. We also found that diamond〈771〉 planes are parallel to silicon〈111〉 planes on which diamonds are directly epitaxially grown on silicon substrate. The interface dislocations are of either 60°-type or Schockley partial dislocation in relation to our observations.
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