Characterization of Carbon Nitride Films Modified by Low Energy Ion-Beam Bombardment

ZM Ren,YC Du,ZF Ying,FM Li,J Lin,YZ Ren,XF Zong
DOI: https://doi.org/10.1016/0168-583x(96)00322-9
1996-01-01
Abstract:Based on our previous synthesis of carbon nitride films containing beta-C3N4 polycrystal grains, post-treatment of these deposited films using low-energy nitrogen ion-beam bombardment was carried out in order to improve the concentration of beta-C3N4 structures in the films. Transmission electron microscopy (TEM) and electron diffraction (ED) measurements showed that the fraction of crystal carbon nitride structure in the films has been improved after such a treatment. X-ray photoelectron spectroscopy (XPS) and Raman analyses confirmed the improvement of the fraction of carbon nitride bonding structures in the modified films. The fractions of amorphous carbon and graphite-like carbon in the films were decreased after the bombardment.
What problem does this paper attempt to address?