Experimental Characterization of On-Chip Single and Double-Coupling Spiral Inductors

Kai Kang,Tao-Soon Yeo,Jinglin Shi,Bin Wu
DOI: https://doi.org/10.1023/B:IJIM.0000047445.50044.13
2004-01-01
International Journal of Infrared and Millimeter Waves
Abstract:Experimental investigations on on-chip single and double-coupling square spiral inductors on silicon substrate are performed. For each pair of double-coupling inductors, they have the same edge distance, but with different turn numbers. Based on the measured S-parameters using de-embedding procedure, the inductance and Q-factor of the single square inductor are examined at first, and good agreement is obtained in the extracted inductance, compared to the predicted values using a closed-form series inductance equation. While for double-coupling spiral inductors, the smaller the product of two turn numbers, the weaker coupling will be, and in particular at low frequencies.
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