Anisotropic Properties of Gan Studied by Raman Scattering

H. C. Lin,Z. C. Feng,M. S. Chen,Z. X. Shen,W. Lu,W. E. Collins
DOI: https://doi.org/10.4028/www.scientific.net/msf.527-529.1517
2006-01-01
Materials Science Forum
Abstract:The phonon anisotropy property of the GaN wurtzite crystal is studied using angular dependent Raman spectroscopy both theoretically and experimentally. The polarized Raman scattering spectra were recorded from cross-sections of c-axis oriented GaN films as a function of the angle between the incident laser polarization direction and the film normal direction in three different configurations. The Raman intensity of A(1)(TO) showed a sinusoidal dependence on the rotating angle, as also did the E-1(TO) mode, while the E-2 mode has a quite different behavior. The theoretical fit takes into account the susceptibility contribution and the phase differential of different vibrating elements.
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