X-ray Stress Measurement for Single Crystal

HUANG Bin,YANG Yanqing,ZENG Dongmei,AI Yanlin
DOI: https://doi.org/10.3969/j.issn.1671-1815.2006.18.052
2006-01-01
Abstract:The stresses of the CdZnTe single crystal have been measured by means of multiple regression analysis and asymmetrical Bragg diffraction. Compared with the conventional methods, the new way can determine the stress states in the plane stress condition more easily almost without the effect of the reliability of the stress-free plane spacing d0.
What problem does this paper attempt to address?