A New Method of Improving the Current Gain of 4H-SiC Lateral BJTs

Deng Yonghui,Sheng Kuang,Xie Gang
DOI: https://doi.org/10.3969/j.issn.1003-353x.2013.05.005
2013-01-01
Abstract:To obtain high current gain of 4H-SiC lateral bipolar junction transistor(BJT) with high breakdown voltage,a new method of achieving current gain was presented and confirmed by simulations.By decreasing doping concentration(NDRI) in the drift region of 4H-SiC lateral BJT,electric field at the base side of the drift region was lowed and collector-base junction depletion extension in the base region was suppressed.Therefore,a high current gain can be obtained by optimization of the base width(WB) and doping(PB) respectively.Simulation results show that when N DRI is decreased to 3.3 1016 cm-3,collector-base junction depletion extends in the base region least.And when with optimized WB of 0.25 mm and PB of 3 1017 cm-3,current gain of the 4H-SiC lateral bipolar junction transistor current gain close to 400 is achieved with breakdown voltage more than 3 000 V.
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