A Novel Design for Multilevel Storage and Superb Reliability in Phase-Change Memory

HONG Yang,LIN Yin-yin,TANG Ting-ao
DOI: https://doi.org/10.3969/j.issn.0427-7104.2006.01.011
2006-01-01
Abstract:A novel ratio-oriented definition based on 2T2R (two transistors & two phase change resistors(PCR)) phase change memory(PCM) cell structure is proposed to gain a high density by multilevel storage.In this novel solution,no reference is needed and superb reliability remains still as conventional 2T2R,which is crucial when feature size scales to nanometer technology node.A behavioral SPICE model together with a preliminary simulation proves the idea to be feasible,and further optimization has been carried out.In addition,based on the ratio-oriented definition,a simpler and faster Error Correction Codes(ECC) can be realized with All-Error-Detection(AED) feasible.
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