Analysis of the Thermo-Optic Effect in Lateral-Carrier-injection SOI Ridge Waveguide Devices

Zhao Jiate,Zhao Yong,Wang Wanjun,Hao Yinlei,Zhou Qiang,Yang Jianyi,Wang Minghua,Jiang Xiaoqing
DOI: https://doi.org/10.1088/1674-4926/31/6/064009
2010-01-01
Journal of Semiconductors
Abstract:>The thermo-optic effect in the lateral-carrier-injection pin junction SOI ridge waveguide is analyzed according to the thermal field equation.Numerical analysis and experimental results show that the thermo-optic effect caused by carrier injection is significant in such devices,especially for small structure ones.For a device with a 1000μm modulation length,the refractive index rise introduced by heat accounts for 1/8 of the total effect under normal working conditions.A proposal of adjusting the electrode position to cool the devices to diminish the thermal-optic effect is put forward.
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