Nonlinear Optical Properties of Silicon Nanocrystals Grown by a SiOx/SiO2 Superlattice Approach

Wei-Jie Lu,Rong-Jun Zhang,Qing-Yuan Cai,Wei-Xi Zhou,Yu-Xiang Zheng,Liang-Yao Chen,Hui Zhou,Shi-Xiong Qian,Se-Young Seo
DOI: https://doi.org/10.3938/jkps.56.1303
2010-01-01
Journal of the Korean Physical Society
Abstract:The nonlinear optical properties have been studied using the Z-scan technique for silicon nanocrystals embedded in a SiO2 matrix formed by high-temperature annealing of SiOx/SiO2 superlattices grown by thermal evaporation. A mode-locked Ti:sapphire laser system producing 140-fs-long pulses at 800 urn was used as the optical source for the Z-scan measurements. The nonlinear refractive index and the nonlinear absorption coefficient of the silicon nauocrystals were found to be 1.2 x 10(-13) cm(2)/W and 1.5 x 10(-9) cm/W, respectively, and to be strongly enhanced compared to those of bulk silicon. Such enhancement of the nonlinear optical properties is considered to be due to the quantum confinement effect of silicon nanocrystals.
What problem does this paper attempt to address?