Epitaxial Growth of 6H-Sic Thin Films on Α-Al2o3 Substrates by SSMBE

康朝阳,刘忠良,唐军,陈香存,徐彭寿,潘国强
DOI: https://doi.org/10.16553/j.cnki.issn1000-985x.2010.02.050
2010-01-01
Abstract:SiC thin films have been epitaxially grown on α-Al2O3(0001)substrates by solid-source molecular beam epitaxy(SSMBE).The structure and crystalline quality of the films were characterized with reflection high energy electron diffraction(RHEED),Raman spectrum,X-ray  scan,Fourier transform infrared spectroscope(FT-IR) and X-ray diffraction(XRD).These results demonstrate that the 6H-SiC films with good crystalline quality are epitaxially grown on the sapphire substrates,and the smaller compressive stress exists in the films because of the difference of the thermal expansion coefficient between the films and the substrates.
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