Composition, microstructure, and thermal stability of silicon carbide chemical vapor deposited at low temperatures

Yongdong Xu,Laifei Cheng,Litong Zhang
DOI: https://doi.org/10.1016/S0924-0136(00)00428-3
IF: 6.3
2000-01-01
Journal of Materials Processing Technology
Abstract:In this paper, the authors have examined the chemical composition, microstructure, and thermal stability of silicon carbide chemical vapor deposited at relatively low temperatures ranging from 1000 to 1300°C. Within the present deposition-temperature range, pure silicon carbide was obtained that was composed mainly of cubic-type beta silicon carbide with a small amount of hexagonal-type silicon carbide. Neither free silicon nor free carbon was found. An Auger spectrum from the surface of the deposit revealed that there was a small amount of chlorine, sulfur, and oxygen on the surface of the silicon carbide. X-ray diffraction and transmission electronic microscopy results indicated that the silicon carbide was poorly crystallized and that the crystallite size was very fine (∼10nm). As the deposition temperatures decreased, the crystallite size became smaller. After silicon carbide had been annealed at 1550°C for 5h in vacuum, crystallite growth and weight loss were noted.
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