Back Contact Interfacial Modification in Highly-Efficient All-Inorganic Planar n-i-p Sb 2 Se 3 Solar Cells

Cong Liu,Kai Shen,Dongxu Lin,Ye Cao,Shudi Qiu,Jianzha Zheng,Feixiong Bao,Yanyan Gao,Hongbing Zhu,Zhiqiang Li,Yaohua Mai
DOI: https://doi.org/10.1021/acsami.0c10629
2020-07-28
Abstract:Sb<sub>2</sub>Se<sub>3</sub> is an emerging and promising light-absorbing material with superior photovoltaic properties. However, the specific one-dimensional structure of Sb<sub>2</sub>Se<sub>3</sub> limits the doping density, preventing a high built-in potential. Moreover, in the superstrate devices the back contact is often non-ohmic. In this work, we have successfully applied tungsten oxide (WO<sub>3-<i>x</i></sub>) as a hole-transport layer in superstrate n-i-p Sb<sub>2</sub>Se<sub>3</sub> solar cells. It is found that an interfacial dipole is formed at Sb<sub>2</sub>Se<sub>3</sub>/WO<sub>3-<i>x</i></sub> interface via Sb–W bonds, which reduces the barrier for hole extraction. Meantime, gap states are present at a suitable energy level to serve as intermediate states for hole-transport from the Sb<sub>2</sub>Se<sub>3</sub> absorber to the metal anode. In addition, the introduction of WO<sub>3-<i>x</i></sub> can suppress carrier recombination at the back interface, enhance the built-in potential, and improve the spectral response in the long-wavelength region. Consequently, the superstrate devices with the incorporated WO<sub>3-<i>x</i></sub> layer achieve a champion efficiency of 7.10% due to the enhancement of all device parameters. Furthermore, the all-inorganic devices with WO<sub>3-<i>x</i></sub> hole-transport layer exhibit excellent air stability and thermal stability.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsami.0c10629?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsami.0c10629</a>.XPS, SEM of WO<sub>3-<i>x</i></sub> films; Tauc plots for band gap calculation of WO<sub>3-<i>x</i></sub> film; integrated <i>J</i><sub>sc</sub>; current density–voltage (<i>J–V</i>) curves measured in both forward and reverse scan directions; d<i>V/</i>d<i>J</i> with the fit used to determine <i>R</i>; cross-sectional SEM and AFM of Sb<sub>2</sub>Se<sub>3</sub> films covered with WO<sub>3-<i>x</i></sub> layers; the <i>V</i><sub>oc</sub>, <i>J</i><sub>sc</sub>, and FF evolution (<a class="ext-link" href="/doi/suppl/10.1021/acsami.0c10629/suppl_file/am0c10629_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
materials science, multidisciplinary,nanoscience & nanotechnology
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