Realization of MoTe2 CMOS inverter by contact doping and channel encapsulation

Tianshun Xie,Mengnan Ke,Keiji Ueno,Kenji Watanabe,Takashi Taniguchi,Nobuyuki Aoki
DOI: https://doi.org/10.35848/1347-4065/ad16bc
IF: 1.5
2024-01-14
Japanese Journal of Applied Physics
Abstract:The Fermi level pinning effect significantly limits the application of electrical devices based on two-dimensional materials like transition metal dichalcogenide. Here, a CMOS inverter, which is comprised of an n- and a p-MoTe2 FET with optimized properties, has been successfully fabricated by using contact doping and channel encapsulation methods. Contact doping is to control the polarity of MoTe2-FET and improve contact properties, which is achieved by laser irradiation in different environmental conditions. The channel of two MoTe2-FETs was encapsulated by hexagonal boron nitride (h-BN) to enhance carrier mobility and device stability. The fabricated CMOS inverter showed a very high gain value of 31 at Vdd = 4 V at RT.
physics, applied
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