Tensile-strained germanium microdisk electroluminescence

M Prost,M El Kurdi,A Ghrib,S Sauvage,X Checoury,N Zerounian,F Aniel,G Beaudoin,I Sagnes,F Boeuf,P Boucaud
DOI: https://doi.org/10.1364/OE.23.006722
2015-03-09
Abstract:We report room temperature electroluminescence of tensile-strained germanium microdisks. The strain is transferred into the microdisks using silicon nitride stressors. Carrier injection is achieved with Schottky contacts on n-type doped germanium. We show that a biaxial tensile-strain up to 0.72% can be transferred by optimizing the carrier injection profile. The transferred strain is measured by the electroluminescence spectral red-shift and compared to finite element modeling. We discuss the impact of this strain level to achieve population inversion in germanium.
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