Quintuple-layer epitaxy of high-quality Bi2Se3 thin films for topological insulator

Guanhua Zhang,Huajun Qin,Jing Teng,Jiandong Guo,Qinlin Guo,Xi Dai,Zhong Fang,Kehui Wu
DOI: https://doi.org/10.1063/1.3200237
2009-06-29
Abstract:We report the growth of atomically smooth, single crystalline Bi2Se3 thin films on Si(111) by using molecular beam epitaxy. Scanning tunneling microscopy, low-energy electron diffraction, X-ray photoelectron emission spectroscopy and Raman spectroscopy were used to characterize the stoichiometry and crystallinity of the film. The film grows in a self-organized quintuple-layer by quintuple-layer mode, and atomically smooth film can be obtained with the thickness down to one quintuple-layer (~1nm).
Mesoscale and Nanoscale Physics,Strongly Correlated Electrons
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