On the origin of epitaxial rhombohedral-B 4 C growth by CVD on 4H-SiC

Sachin Sharma,Laurent Souqui,Justinas Palisaitis,Duc quang Hoang,Ivan G. Ivanov,Per Persson,Hans Hogberg,Henrik Pedersen
DOI: https://doi.org/10.1039/d4dt01157k
IF: 4
2024-06-06
Dalton Transactions
Abstract:Rhombohedral boron carbide, often referred to as r-B 4 C, is a potential material for applications in optoelectronic and thermoelectric devices. From fundamental thin film growth and characterization, we investigate the film-substrate interface between the r-B 4 C films grown on 4H-SiC (0001 @#x0305;) (C-face) and 4H-SiC (0001) (Si-face) during chemical vapor deposition (CVD) to find the origin for epitaxial growth solely observed on the C-face. We used high-resolution (scanning) transmission electron microscopy and electron energy loss spectroscopy to show that there is no surface roughness or additional carbon-based interlayer formation for either substrate. Based on Raman spectroscopy analysis, we also argue that carbon accumulation on the surface hinders the growth of continued epitaxial r-B 4 C in CVD.
chemistry, inorganic & nuclear
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