Multilayer Epitaxial Growth and Fabrication of 4H-SiC BJT with Double Base Epilayers

Yu-Ming Zhang,Lei Yuan,Yi-Men Zhang,Xiao-Yan Tang,Qing-Wen Song,Xiao-Peng Zhang,Qian Zhang
DOI: https://doi.org/10.1149/05003.0411ecst
2013-03-15
ECS Transactions
Abstract:Multilayer epitaxial growth (n+/p+/p-/n-) of 4H-SiC including double P-type epilayers was performed in the horizontal low-pressure hot-wall CVD(LP-HW-CVD). With the measurements of secondary ion mass spectroscopy (SIMS), atomic force microscope (AFM), Raman scattering and optical microscope, the doping concentration, surface morphology and crystalline quality of the epitaxial film were characterized. 4H-SiC BJTs with double base were fabricated on the epitaxial wafer. I-V characteristics of the device are presented.
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