Reconfigurable logic-in-memory circuits with ferroelectric nanosheet field-effect transistors

TianTong Cheng,Jia-Cheng Li,Yu-Xi Yang,Qiang Li,Hsiao-Hsuan Hsu,Zhi-Wei Zheng
DOI: https://doi.org/10.1088/1402-4896/ad92b9
2024-11-22
Physica Scripta
Abstract:To accommodate the requirements of small device dimensions and the application of ferroelectric field-effect transistors (FeFETs) in logic-in-memory circuits, we realize the reconfigurable logic-in-memory circuits with ferroelectric nanosheet field-effect transistors (FeNSFETs) through simulation. By evaluating the memory window and logic performances of the devices, it is demonstrated that the key to constructing logical functions are the magnitudes of the drain current at program (PGM) and erase (ERS) state when VG = 0 V. We find that appropriately increasing the number of nanosheets can enhance the current at PGM state, and appropriately increasing the write voltage can decrease the current at ERS state, which are both beneficial for the achievement of reconfigurable circuits. Thus, it is necessary to take into consideration the trade-offs between the process complexity, power consumption, and logical function realization. This work contributes to the prospective design for ferroelectric reconfigurable logic-in-memory circuits.
physics, multidisciplinary
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