Experimental results from spectroscopic ellipsometry on the (7 × 7)Si(111) surface reconstruction: dielectric function determination

Z. Hammadi,M. Gauch,P. Müller,G. Quentel
DOI: https://doi.org/10.1016/0039-6028(95)00592-7
IF: 1.9
1995-11-01
Surface Science
Abstract:The dielectric function of the (7 × 7) Si(111) surface has been directly determined in UHV conditions by ellipsometric measurements on a Si(111) clean surface. The dielectric function obtained from ellipsometric spectra near the pseudo-Brewster angle (PB) has been calculated by means of a three-phase model (bulk, (7 × 7) transition layer and vacuum) in which optical properties of bulk Si are deduced from literature data and the thickness of the (7 × 7) transition layer is taken from the DAS model. Our calculation allows us to confirm the metallic character of the (7 × 7) transition layer and to point out the previously found surface-state transitions at 2.6 and 3.4 eV and perhaps at 1.6 eV. Furthermore, a surface-state transition has also been confirmed at 3 eV. Ellipsometric results depend on the crystallographic direction. This optical anisotropy is ascribed to some roughness anisotropy induced by steps.
chemistry, physical,physics, condensed matter
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