3-D Scaling Rules for High-Voltage Planar Clustered IGBTs

Peng Luo,Shankar Narayanan Ekkanath Madathil
DOI: https://doi.org/10.1109/ted.2020.3031552
IF: 3.1
2020-12-01
IEEE Transactions on Electron Devices
Abstract:In this article, an approach for design optimization of high-voltage (≥3300 V) planar clustered insulated gate bipolar transistor (CIGBT) is proposed and investigated through TCAD simulations. New 3-D scaling rules are employed in this approach to improve the electrical characteristics and widen the safe operating area. As shown in the simulation results, a scaled 4.5-kV field-stop CIGBT can achieve an ON-state voltage drop of 1.78 V at ${T}_{j} = {300}$ K and ${J}_{c} = {50}$ A/cm<sup>2</sup>, mainly due to the enhancement of inherent thyristor action. High levels of turn-off robustness are maintained by the scaled CIGBTs. In addition, the scaling rules also result in improved short-circuit robustness due to control of current saturation levels. Furthermore, by integrating the 3-D scaling rules with the trench CIGBTs, the ON-state performance shows significant improvement compared with the state-of-the-art IGBT technologies. Therefore, scaling rules on CIGBTs is a highly promising approach for enhancing the converter efficiency in medium- and high-voltage applications.
engineering, electrical & electronic,physics, applied
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