Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
Jun Uzuhashi,Jun Chen,Ashutosh Kumar,Wei Yi,Tadakatsu Ohkubo,Ryo Tanaka,Shinya Takashima,Masaharu Edo,Kacper Sierakowski,Michal Bockowski,Hideki Sakurai,Tetsu Kachi,Takashi Sekiguchi,Kazuhiro Hono
DOI: https://doi.org/10.1063/5.0087248
IF: 2.877
2022-05-14
Journal of Applied Physics
Abstract:Journal of Applied Physics, Volume 131, Issue 18, May 2022. An area selective doping via ion implantation is a key technology to realize gallium nitride (GaN) based energy-efficient power devices; however, conventional annealing leads to the formation of numerous Mg-enriched defects, which result in inefficient p-type activation. The recent invention of ultra-high-pressure annealing (UHPA) has enabled a significant improvement in p-type activation efficiency. In this study, we investigated the formation of Mg-enriched defects in Mg implanted GaN followed by annealing under either conventional atmospheric pressure or ultra-high-pressure. Unlike the conventional annealing, UHPA leads to a much lower number density of Mg-enriched defects. Correlative scanning transmission electron microscopy, atom probe tomography, cathodoluminescence, and secondary ion mass spectrometry analyses have shown that the number density of Mg-enriched defects is substantially suppressed by the UHPA. The dissolved Mg concentrations in the GaN matrix for both the conventional and the UHPA samples are almost of the same value, approximately 2 × 1018 cm−3; however, the UHPA sample shows over one order of magnitude stronger intensity of donor–acceptor-pair emission than the conventional one. Thus, the implanted Mg is effectively activated as acceptors through the UHPA technique.
physics, applied