Abstract:A novel structure design of the p‐type low‐temperature polycrystalline silicon thin‐film transistor applied to the pixel structure of the display is proposed to achieve the improvement of the aperture ratio and the hot‐carrier reliability. With the use of the proposed architecture, displays can possess the advantageous properties of high‐resolution, which may motivate the present state of the art to further approach future displays. In this study, a novel structural design of the p‐type low‐temperature polycrystalline silicon thin‐film transistors (p‐type LTPS TFTs) applied to the pixel structure of displays is proposed. Compared to the conventional pixel structure of displays, the proposed architecture can achieve the aperture ratio improvement by stacking the switch thin‐film transistor and the storage capacitor in a pixel region to enlarge the active space. Therefore, the demands of high‐resolution characteristics, such as a high aperture ratio, and high pixel densities for high‐end displays or novel technologies, can be satisfied by the adoption of the proposed design concept. Furthermore, the discussion of experimental and simulated results in terms of device physics of the transistor indicates that proposed TFTs possess higher performance and reliability properties. By modulating the geometry of the drain‐connected bottom metal in stacked TFTs, output characteristics and hot carrier phenomenon in devices can be further improved. Time‐dependent transfer characteristics, extracted electrical parameters, and numerical simulation results are performed to support our design.

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