Electrospinning-Driven InHfOx Nanofiber Channel Field-Effect Transistors and Humidity Stability Exploration

Jin Yan,Gang He,Bo He,Qingqing Hu,Qian Gao,Shanshan Jiang,Yanmei Liu
DOI: https://doi.org/10.1109/ted.2022.3205875
IF: 3.1
2022-10-26
IEEE Transactions on Electron Devices
Abstract:High-performance field-effect transistors (FETs) based on electrospun Hf-doped In2O3 nanofibers as channel layers have been constructed in this article. InHfOx nanofibers were studied using scanning electron microscopy (SEM), X-ray diffraction (XRD), and electrical measurements to investigate their crystallinity, surface morphology, and electrical properties. Enhanced electrical performance has been achieved for FETs with an optimized Hf doping concentration of 3%, including high field-effect mobility ( ) of 1.93 cm2V−1s−1, a large of 7, a low of 0.59 V, and a small interfacial trap state ( ) of 11 cm−3. Humidity stability explorations have indicated that InHf -based FET device performance is the most stable of all devices, confirmed by low-frequency noise (LFN) measurements and positive bias stress tests (PBSTs). The main reason can be attributed to the Hf-doping-induced hydrophobicity of InHfOx nanofibers. To demonstrate the capability of the device in more complex logic circuits, a resistor-loaded inverter based on InHf /SiO2 FET exhibits excellent full swing characteristics with a voltage gain of 3. Our work has indicated the great potential prosp- cts of electrospinning-derived nanofiber-based FETs in future oxide-based electronics.
engineering, electrical & electronic,physics, applied
What problem does this paper attempt to address?