Investigation of Solid-Liquid Interface Effects on the Impurity Concentration in the DS Grown Mc-Si Ingot by using C-Clamp Insulation Block for Solar Cell Applications: Numerical Analysis

Sugunraj Sekar,Srinivasan Manikkam,Ramasamy Perumalsamy
DOI: https://doi.org/10.1007/s12633-023-02839-z
IF: 3.4
2023-12-31
Silicon
Abstract:A C-clamp insulation block was designed and installed at the top of the heat exchanger block (HEB) in a lab-scale directional solidification system (DSS) to produce the high-efficiency multi-crystalline Silicon (mc-Si) ingot for solar cell applications. The transient global model is used to study the DSS's heat transport and investigate the effect of modified DSS on the solid-liquid (S-L) interface, power consumption, and impurity concentration. Results are compared. The simulation results show that the modified DSS grown mc-Si ingot's power consumption of 489 kWh, is comparatively lower than the conventionally grown ingot's power consumption of 544 kWh. The S-L interface shape changes from W-shape to convex in the conventional DSS growth and in the modified DSS growth is changed from highly convex to slightly convex S-L interface. The radial temperature gradient increases due to rapid growth in the modified DSS. However, the conventional DSS ingot has a lower radial temperature gradient due to the heat extraction from the side silica crucible wall (SCW). So, it maintains the minimum temperature gradient at the margin of the grown mc-Si ingot. The S-L interface and the growth rates affect the oxygen and carbon concentration in the grown mc-Si ingot. The oxygen concentration in the conventional DSS grown ingot ranges from 1.20E12 to 8.00E17 atoms/cm 3 and in the modified DSS grown ingot it ranges from 1.20E12 to 2.40 E17 atoms/cm 3 . The carbon concentration in the conventional DSS grown ingot ranges from 1.58E16 to 1.60E17 atoms/cm 3 and in the modified DSS grown ingot it ranges from 1.58E16 to 8.79E16 atoms/cm 3 . The modified DSS-grown ingot gained maximum oxygen and carbon concentration in the ingot red zone. It need not be considered for practical applications. The modified ingot reduces the wire saw damage in the wafering process due to the presence of minimum carbon concentration. Due to the lower oxygen concentration level in the modified DSS grown mc-Si ingot, the LID effect reduces in the solar cell .
materials science, multidisciplinary,chemistry, physical
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