Lattice and electronic structure of ScN observed by angle-resolved photoemission spectroscopy measurements

Hayder A. Al-Atabi,Xiaotian Zhang,Shanmei He,Cheng chen,Yulin Chen,Eli Rotenberg,James H. Edgar
DOI: https://doi.org/10.1063/5.0119628
IF: 4
2022-10-31
Applied Physics Letters
Abstract:Scandium nitride (ScN) has recently attracted much attention for its potential applications in thermoelectric energy conversion, as a semiconductor in epitaxial metal/semiconductor superlattices, as a substrate for GaN growth, and alloying it with AlN for 5G technology. This study was undertaken to better understand its stoichiometry and electronic structure. ScN (100) single crystals 2 mm thick were grown on a single crystal tungsten (100) substrate by a physical vapor transport method over a temperature range of 1900–2000 °C and a pressure of 20 Torr. The core level spectra of Sc 2 p 3/2,1/2 and N 1 s were obtained by x-ray photoelectron spectroscopy (XPS). The XPS core levels were shifted by 1.1 eV toward higher values as the [Sc]:[N] ratio varied from 1.4 at 1900 °C to ∼1.0 at 2000 °C due to the higher binding energies in stoichiometric ScN. Angle-resolved photoemission spectroscopy measurements confirmed that ScN has an indirect bandgap of ∼1.2 eV.
physics, applied
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