Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste

Singh, Devdutt

DOI: https://doi.org/10.1007/s40033-022-00418-x

2022-11-15

Journal of The Institution of Engineers (India): Series D

Abstract:In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and Al 2 O 3 particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation.