Abstract:Different symmetry phases are identified in PbZr0.6Ti0.4O3 ferroelectric thin films as function of the strain introduced by CaF2, SrTiO3 and PMN‐PT substrates. Measured strain‐temperature paths are successfully described by a multi‐domain LGD‐model that predicts the symmetry phases and phase transitions, and the observed enhanced piezoelectricity in one of the phases. Lead based bulk piezoelectric materials, e.g., PbZrxTi1‐xO3 (PZT), are widely used in electromechanical applications, sensors, and transducers, for which optimally performing thin films are needed. The results of a multi‐domain Landau–Ginzberg‐Devonshire model applicable to clamped ferroelectric thin films are used to predict the lattice symmetry and properties of clamped PZT thin films on different substrates. Guided by the thermal strain phase diagrams that are produced by this model, experimentally structural transitions are observed. These can be related to changes of the piezoelectric properties in PZT(x = 0.6) thin films that are grown on CaF2, SrTiO3 (STO) and 70% PbMg1/3Nb2/3O3‐30% PbTiO3 (PMN‐PT) substrates by pulsed laser deposition. Through temperature en field dependent in situ X‐ray reciprocal space mapping (RSMs) and piezoelectric force microscopy (PFM), the low symmetry monoclinic phase and polarization rotation are observed in the film on STO and can be linked to the measured enhanced properties. The study identifies a monoclinic ‐rhombohedral MC‐MA‐R crystal symmetry path as the polarization rotation mechanism. The films on CaF2 and PMN‐PT remain in the same symmetry phase up to the ferroelectric‐paraelectric phase transition, as predicted. These results support the validity of the multi‐domain model which provides the possibility to predict the behavior of clamped, piezoelectric PZT thin films, and design films with enhanced properties.

Imprint effect in PZT thin films at compositions around the morphotropic phase boundary

Local-scale structures across the morphotropic phase boundary in PbZr1- x Ti x O3

In situ X-ray reflectivity study of imprint in ferroelectric thin films

<i>In Situ</i> X-Ray Reflectivity Study of Imprint in Ferroelectric Thin Films

Origin of high piezoelectricity at the morphotropic phase boundary (MPB) in (Pb0.94Sr0.06)(ZrxTi1-x)O3

Effects of Hydrostatic Pressure on Pb(Zr1−xTix)O3 Near the Morphotropic Phase Boundary

The monoclinic phase in PZT: new light on morphotropic phase boundaries

Determination of Imprint Effects in Ferroelectrics from the Quantified Phase and Amplitude Response

Octahedral tilting, monoclinic phase and the phase diagram of PZT

The factors behind the morphotropic phase boundary in piezoelectric perovskites

Huge Enhancement of Electromechanical Responses in Compositionally ModulatedPb(Zr1−x

Enhanced Piezoelectricity by Polarization Rotation through Thermal Strain Manipulation in PbZr0.6Ti0.4O3 Thin Films

Thickness-Dependent Phase Transition and Piezoelectric Response in Textured Nb-Doped Pb(Zr0.52Ti0.48)O3 Thin Films

Composition-driven structural phase transition in ferroelectric PbZrxTi1-xO3 across the morphotropic phase boundary

Effect of the orientation polarization and texturing on nano-mechanical and piezoelectric properties of PZT (52/48) films

Ultrahigh Piezoelectric Strains in PbZr1−xTixO3 Single Crystals with Controlled Ti Content Close to the Tricritical Point

Enhanced ferro- and piezoelectric properties in (100)-textured Nb-doped Pb(ZrxTi1 - x)O3 films with compositions at morphotropic phase boundary

Indentation size effect in soft PZT ceramics with tetragonal structure close to the MPB

Temperature-dependent electrical properties of 0.5Pb(Ni 1/3 Nb 2/3 )O 3 –(0.5 − x )PbTiO 3 – x PbZrO 3 piezoceramics near the morphotropic phase boundary

Near-Infrared Spectroscopy of the Cassiopeia A and Kepler Supernova Remnants

Intrinsic piezoelectricity of PZT