Study of a through-silicon/substrate via filling method based on the combinative effect of capillary action and liquid bridge rupture

Jiebin Gu,Bingjie Liu,Gaoli Chen,Xinxin Li
DOI: https://doi.org/10.1088/0960-1317/26/7/075009
2016-06-10
Journal of Micromechanics and Microengineering
Abstract:Through-silicon via (TSV) is increasing its importance in advanced device packaging. In this paper, a through-silicon/substrate via filling method based on the combinative effect of liquid bridge rupture and capillary action is proposed and demonstrated. The proposed method is able to achieve alloy vias from the surface of a molten alloy pool. Two different processes were tested in experiments and the results show that one of these processes is able to achieve fully filled vias. In addition, a piece of equipment was specially made for the proposed via filling method. The via filling method studied in this paper has a potential application for TSVs in MEMS packaging.
engineering, electrical & electronic,nanoscience & nanotechnology,instruments & instrumentation,physics, applied
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