One Time Programmable Antifuse Memory Based on Bulk Junctionless Transistor

Jin-Woo Han,Dong-Il Moon,M. Meyyappan
DOI: https://doi.org/10.1109/led.2018.2848975
IF: 4.8157
2018-08-01
IEEE Electron Device Letters
Abstract:One time programmable (OTP) antifuse base memory is demonstrated based on a bulk junctionless gate-all-around (GAA) nanowire transistor technology. The presented memory consists of a single transistor (1T) footprint without any process modification. The source/drain (S/D) and gate, respectively, become bit line and word line where the antifuse is formed by oxide breakdown across the gate and the channel. The channel is connected directly to the bit line due to junctionless S/D and inherently isolated from the neighboring cell by the GAA channel. Therefore, an array of 1T antifuse OTP can be a candidate for the sub-5-nm technology node.
engineering, electrical & electronic
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