Effect of Ion Irradiation on Amorphous and Crystalline Ge–Se and Their Application as Phase Change Temperature Sensor

Al-Amin Ahmed Simon,Lyle Jones,Yoshifumi Sakaguchi,Henri Kunold,Isabella van Rooyen,Maria Mitkova
DOI: https://doi.org/10.1002/pssb.202000429
2020-11-17
physica status solidi (b)
Abstract:Research on phase change materials is predominantly focused on their application as memory devices or for temperature control which require low phase change temperature. The Ge‐Se binary chalcogenide glass system with its wide glass‐forming region is a potential candidate for high‐temperature and high‐radiation phase change applications. This paper reports the concept of employing GexSe100−x glasses, to monitor high‐temperature (450‐528°C) using the phase change effect. Materials selection, device structure and a prototype of sensor performance have been analysed. In addition, the effect of heavy ion irradiation by Xe ions with energy 200, 600, and 1000 keV (Fluence approx. 1014 cm−2) over GexSe100−x (x=30, 33, 40) thin films and phase change devices have been studied. The irradiation effect on the amorphous and crystalline structure of the thin films were evaluated by Raman spectroscopy and XRD. Although the changes in the structural units of amorphous films are negligible, in crystalline films orthorhombic‐GeSe2 crystals are found to be most affected by irradiation and a new phase, orthorhombic‐GeSe is found in the thin films after irradiation. The performance of a sensor with an active film of Ge40Se60 is also shown as an example.This article is protected by copyright. All rights reserved.
physics, condensed matter
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