Abstract:Modern high-resolution scanning electron microscopes (SEM), equipped with field emission guns (FEGs), designed to operate at low acceleration voltage, have opened new opportunities to study conductive or insulating systems, without conductive coating. Better electron sources, optics, vacuum, and detectors allow high-resolution SEM to serve as a powerful characterization and analytical tool, and provide invaluable information about structure-property relations of nanomaterials and related applications. Slight specimen charging can be exploited to enhance contrast between different materials and phases, with minimum imaging artifacts. Optimization of charging effects and improved micrograph contrast are essential for the study of different-scale features in ceramics, polymers, organic materials, and thermally fixed liquids, including in biological research. The operating SEM parameters can be adjusted to a specific specimen based on prior knowledge of interaction of the electron beam with similar specimens, and the type of information one wishes to acquire. In this work we examined the effect of the acceleration voltage and the use of different detectors on the contrast formation in several types of specimens, focusing on materials formed mainly of carbon and oxygen, with low inherent contrast in the SEM. That includes cryogenic SEM (cryo-SEM) to study emulsions in their native state. We also studied by cryo-SEM carbon nanotubes (CNTs) dispersed in water and dissolved in superacid. HR-SEM at room temperature was performed on CNT films, deposited on glass. We show how micrograph contrast changes with different detectors, at different acceleration voltages. Judicious selection of the SEM operation parameters leads to optimal picture contrast between domains of different composition.

Optimizing the SEM specimen preparation method for accurate microanalysis of carbon nanotube/nanocluster hybrids

Self-marked preparation of site-specific transmission electron microscope lamellae of nanodevices using focusing ion beam technique.

Quantitative analysis of electron field-emission characteristics of individual carbon nanotubes: The importance of the tip structure

Electron Beam Interaction with Carbon Nanotubes in Scanning Electron Microscope: Mechanisms and Applications

Scanning Electron Microscopy Imaging of Single-Walled Carbon Nanotubes on Substrates

SEM imaging of insulating specimen through a transparent conducting veil of carbon nanotube

Novel Nanostructured Carbon Nanotube Electron Sources

SEM in Molecular Sieve Morphology Research-The Effect on Photograph Quality by Sample Preparation and Apparatus Parameter Settings

Scanning Electron Microscopy Imaging of Single-Walled Carbon Nanotubes and Devices

Direct Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes in Scanning Electron Microscopy.

In Situmultiproperty Measurements of Individual Nanomaterials in SEM and Correlation with Their Atomic Structures

Heterodyne High-Harmonic Electrostatic Force Microscopy with Improved Spatial Resolution for Nanoscale Identification of Metallic/Semiconducting Carbon Nanotubes

A Study on Biological Sample Preparation for High Resolution Imaging of Scanning Electron Microscope

Analysis and Calibration of Electron-Dispersive Spectroscope and Scanning Electron Microscope Parameters to Improve their Results

Direct discrimination between semiconducting and metallic single-walled carbon nanotubes with high spatial resolution by SEM

In-situ manipulating,fabricating and measuring nanostructures inside SEM

Preparative Ultracentrifuge Method for Characterization of Carbon Nanotube Dispersions

Carbon-nanotube-assisted transmission electron microscopy characterization of aerosol nanoparticles

An optimized TEM specimen preparation method of quantum nanostructures

Micrograph contrast in low-voltage SEM and cryo-SEM

A New Method for Estimating Nanoparticle Deposition Coverage from a Set of Weak-Contrast SEM Images